I am reviewing the specifications for the A42MX24-PLG84 for the potential purchasing with NAC Group.
In the attached specifications, both in Table 1-9 and in Table 1-16, the VOH values are defined against -10mA IOH for Commercial Grade, but against -4mA IOH for the Industrial Grade. The VOL values are also defined differently with 10mA IOL and 6mA IOL separately for the Commercial and Industrial Grades. Do you know the reason why they must be defined this way? Does this mean the Commercial Grade is suggested/allowed to source/sink more current (up to 10mA), while the Industrial Grade is suggested/allowed to source/sink less current (up to 4mA/6mA)?
The reason for this difference in choice of test condition is not immediately apparent.
That said, test conditions are just that–the conditions of test under which conformity to specification is evaluated. No limitation of device capability is implied by a choice of test condition–those would be the sort of thing given as Absolute Maximum values.
Please allow me to speculate that the difference is attributed to temperature. Consider the temperature range for each device:
• Commercial (0 to +70°C)
• Industrial (–40 to +85°C)
• Military (–55 to +125°C)
• Automotive (–40 to +125°C)
Given that semiconductors are often derated for elevated temperatures, it would stand to reason that the industrial rated devices are evaluated at a lower current. We can expect even less for an automotive-rated semiconductor.
Sorry, I couldn’t give you a more definitive answer.
P.S. For those unfamiliar with the term derating, please consider the junction temperature of semiconductor. Know that overheating can lead to shortened life or in extreme cases catastrophic destruction of the semiconductor. Derating is a design consideration whereby we reduce the current passing though the semiconductor for elevated temperatures. Lower current yields lower temperature which yields longer life.