Thanks for the tables!
Two things I’d add:
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It’s probably more correct to call it a temperature “characteristic” since the term “coefficient” usually implies some sort of linear-ish relationship. Outside of the class 1 devices, the capacitance vs. temperature relationship isn’t all that linear:
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In speaking about a “max capacitance change” it should be noted that this refers to the effects of TEMPERATURE ONLY, measured under very specific test conditions. Other factors, most notably DC bias effect and aging, can cause enormous changes in observed capacitance.
